Quote
A. Walsemann, M. Karagounis, A. Stanitzki, and D. Tutsch, "Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications," Journal of Instrumentation, vol. 19, pp. C02012-C02012, 2024.
References
DOI 10.1088/1748-0221/19/02/C02012