Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications

Fast facts

• Internal authorship

  Prof. Dr. Michael Karagounis

• Further publishers

  Alexander Walsemann, Alexander Stanitzki, Dietmar Tutsch

• Publishment

  • 2024

• Anthology

  Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications

• Title of the conference proceedings

  19

• Journal

  Journal of Instrumentation

• Organizational unit

  Electrical engineering

• Subjects

  • Micro- and nanoelectronics

• Research fields

  • Learning Chips Lab (LCL)

• Publication format

  Journal article (Article)