Jump to content

Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry

Fast facts

Quote

Schulz, Peter & Wolff, Carsten 2019. Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry. 2019 IEEE AUTOTESTCON, 1-5.

Notes and references

This site uses cookies to ensure the functionality of the website and to collect statistical data. You can object to the statistical collection via the data protection settings (opt-out).

Settings(Opens in a new tab)