Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry

Fast facts

• Internal authorship

  Prof. Dr. Carsten Wolff

• Further publishers

  Peter Schulz

• Publishment

  • 2019

• Anthology

  Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry

• Title of the conference proceedings

  2019 IEEE AUTOTESTCON

• Organizational unit

  • IDiAL
  • Electrical engineering
  • Computer science

• Subjects

  • Computer science in general

• Publication format

  Conference paper