Zitat
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” in 2019 IEEE AUTOTESTCON, 2019, pp. 1–5.
Referenzen
DOI 10.1109/AUTOTESTCON43700.2019.8961895
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry
Konferenzpaper
Schnelle Fakten
Interne Autorenschaft
Veröffentlichung
- 2019
Organisationseinheit
Fachgebiete
- Informatik allgemein