Quote
P. Schulz and C. Wolff, "Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry," in 2019 IEEE AUTOTESTCON, 2019, pp. 1-5.
References
DOI 10.1109/AUTOTESTCON43700.2019.8961895
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry
Conference paper
Fast facts
Internal authorship
Publishment
- 2019
Organizational unit
Subjects
- Computer science in general